コンテンツへスキップ
Japanese
お問い合わせ
製品センター

半導体・ICの試験

テスト・計測機器を、カテゴリ、ブランド、またはモデル別に閲覧できます。.

すべてのフィルターを解除する
24 製品
中古

キースリー ·

2601B-PULSE

10 A at 10 V pulses with qualified duty cycle, 10–500 µs pulse widths, dual pulser digitizers, and separate DC SMU operation.
Official manufacturer reference image of the Keithley 2601B-PULSE System SourceMeter Pulser and SMU
Official Keithley 2601B-PULSE product reference. Offered-unit configuration requires confirmation.
中古

キースリー ·

2612B

Dual-channel SMU with 200 V/1.5 A DC operating points, qualified 10 A pulses, TSP scripting, and TSP-Link.
Official Keithley 2600B series reference image for the 2612B product listing
Official Keithley 2600B series reference for model 2612B. Multiple instruments are shown.
中古

キースリー ·

2400

Single-channel 20 W SMU with 200 V/1 A operating limits, I-V testing, resistance measurement, and automated sweeps.
Official manufacturer reference image of the Keithley 2400 SourceMeter Source Measure Unit
Official Keithley 2400 product reference. Offered-unit configuration requires confirmation.
中古

キースリー ·

2510-AT

50 W TEC control with automatic PID tuning, a −50 °C to +225 °C setpoint range, and IEEE-488/RS-232 integration.
Official manufacturer photograph of the Keithley 2510-AT from an English product document
Official Keithley 2510-AT product photograph from the manufacturer document.
中古

キースリー ·

2510

50 W TEC control with programmable PID gains, a −50 °C to +225 °C setpoint range, and IEEE-488/RS-232 integration.
Official Keithley 2510 and 2510-AT family reference photograph showing model 2510-AT
2510/2510-AT manufacturer family photograph showing model 2510-AT. The shared official document explicitly lists 2510.