반도체 및 IC 테스트

10 A at 10 V pulses with qualified duty cycle, 10–500 µs pulse widths, dual pulser digitizers, and separate DC SMU operation.

Dual-channel SMU with 200 V/1.5 A DC operating points, qualified 10 A pulses, TSP scripting, and TSP-Link.

Single-channel 20 W SMU with 200 V/1 A operating limits, I-V testing, resistance measurement, and automated sweeps.

50 W TEC control with automatic PID tuning, a −50 °C to +225 °C setpoint range, and IEEE-488/RS-232 integration.

50 W TEC control with programmable PID gains, a −50 °C to +225 °C setpoint range, and IEEE-488/RS-232 integration.